Publications
X Author: R. Waser
2007
Jia, C.-L., V. Nagarajan, J.-Q. He, L. Houben, T. Zhao, Ramamoorthy Ramesh, K. Urban, and R. Waser."Unit-cell scale mapping of ferroelectricity and tetragonality in epitaxial ultrathin ferroelectric films."Nature Materials
6 (2007) 64-69. DOI
2006
Nagarajan, V., J. Junquera, J.Q. He, C.L. Jia, R. Waser, K. Lee, Y.K. Kim, Sunhee Baik, T. Zhao, Ramamoorthy Ramesh, Ph. Ghosez, and K.M. Rabe."Scaling of structure and electrical properties in ultrathin epitaxial ferroelectric heterostructures."Journal of Applied Physics
100 (2006). DOI
Petraru, A., V. Nagarajan, H. Kohlstedt, Ramamoorthy Ramesh, D.G. Schlom, and R. Waser."Simultaneous measurement of the piezoelectric and dielectric response of nanoscale ferroelectric capacitors by an atomic force microscopy based approach."Applied Physics A: Materials Science and Processing
84 (2006) 67-71. DOI
2005
Nagarajan, V., C.L. Jia, H. Kohlstedt, R. Waser, I.B. Misirlioglu, S.P. Alpay, and Ramamoorthy Ramesh."Misfit dislocations in nanoscale ferroelectric heterostructures."Applied Physics Letters
86 (2005) 1-3. DOI
Nagarajan, V., S. Aggarwal, A. Gruverman, Ramamoorthy Ramesh, and R. Waser."Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments."Applied Physics Letters
86 (2005) 1-3. DOI
2004
Nagarajan, V., S. Prasertchoung, T. Zhao, H. Zheng, J. Ouyang, Ramamoorthy Ramesh, W. Tian, X.Q. Pan, D.M. Kim, C.B. Eom, H. Kohlstedt, and R. Waser."Size effects in ultrathin epitaxial ferroelectric heterostructures."Applied Physics Letters
84 (2004) 5225-5227. DOI
2002
Roelofs, A., N.A. Pertsev, R. Waser, F. Schlaphof, L.M. Eng, C. Ganpule, V. Nagarajan, and Ramamoorthy Ramesh."Depolarizing-field-mediated 180° switching in ferroelectric thin films with 90° domains."Applied Physics Letters
80 (2002) 1424-1426. DOI
Ganpule, C.S., V. Nagarajan, B.K. Hill, A.L. Roytburd, E.D. Williams, Ramamoorthy Ramesh, S.P. Alpay, A. Roelofs, R. Waser, and L.M. Eng."Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films."Journal of Applied Physics
91 (2002) 1477-1481. DOI
2001
Tiedke, S., T. Schmitz, K. Prume, A. Roelofs, T. Schneller, U. Kall, R. Waser, C.S. Ganpule, V. Nagarajan, A. Stanishevsky, and Ramamoorthy Ramesh."Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope."Applied Physics Letters
79 (2001) 3678-3680. DOI
Schmitz, T., K. Prume, S. Tiedke, A. Roelofs, T. Schneller, U. Kall, M. Grossmann, R. Waser, C. Ganpule, A. Stanishefsky, and Ramamoorthy Ramesh."Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors."Integrated Ferroelectrics
37 (2001) 163-172. DOI