Publications
X Author: F.C. Wellstood
2000
Steinhauer, D.E., C.P. Vlahacos, F.C. Wellstood, S.M. Anlage, C. Canedy, Ramamoorthy Ramesh, A. Stanishevsky, and J. Melngailis."Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope."Review of Scientific Instruments
71 (2000) 2751-2758. DOI
1999
Steinhauer, D.E., C.P. Vlahacos, F.C. Wellstood, S.M. Anlage, C. Canedy, Ramamoorthy Ramesh, A. Stanishevsky, and J. Melngailis."Imaging of microwave permittivity, tunability, and damage recover in (Ba, Sr)TiO3 thin films."Applied Physics Letters
75 (1999) 3180-3182. DOI