Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

Publication Type

Journal Article

Authors

Auciello, O., A. Gruverman, H. Tokumoto, S.A. Prakash, S. Aggarwal, Ramamoorthy Ramesh

Journal

MRS Bulletin

Volume

23

Year of Publication

1998

ISSN

08837694

Notes

cited By 82

Research Areas

Ramesh Lab

A U.S. Department of Energy National Laboratory Managed by the University of California

Questions & Comments Privacy & Security Notice