Finite element modeling of piezoresponse in nanostructured ferroelectric films
Publication Type
Journal Article
Authors
DOI
Abstract
The converse piezoresponse measured by the surface displacement of ferroelectric islands, with lateral size changing from a nanoscale to a continuous film was modeled by using three-dimensional finite element method. It was shown that the piezodeformation of the islands results in a local deformation of a substrate in the vicinity of island. The piezoresponse of different size island capacitors with PbZr 0.5Ti 0.5O 3/SrTiO 3/Si and PbZr 0.2Ti 0.8O 3/SrTiO 3 heterostructures was also calculated. The patterning thin ferroelectric films into discrete islands was an effective way to release the constraint imposed by a substrate.
Journal
Applied Physics Letters
Volume
84
Year of Publication
2004
ISSN
00036951
Notes
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