Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging
Publication Type
Journal Article
Authors
Chang, H.J., S.V. Kalinin, A.N. Morozovska, M. Huijben, Y.-H. Chu, P. Yu, Ramamoorthy Ramesh, E.A. Eliseev, G.S. Svechnikov, S.J. Pennycook, A.Y. Borisevich
DOI
Abstract
Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Journal
Advanced Materials
Volume
23
Year of Publication
2011
ISSN
09359648
Notes
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